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采用等离子体化学气相沉积(PECVD)技术在不同N2O流量条件下制备了镶嵌有纳米晶硅(nc-Si)的富硅氧化硅(SiOx)薄膜,利用透射电镜(TEM),X射线衍射分析(XRD),傅里叶变换红外(FTIR)和透射光谱技术研究了薄膜中的氢含量和氧含量变化及其对薄膜晶化度、薄膜键合结构和光吸收特性的影响.结果表明,薄膜由nc-Si粒子和非晶SiOx组成,为混合相结构.nc-Si的生长与氧化反应的竞争决定了薄膜微观结构、键合特性以及光吸收特性.随着N2O流量的增加,薄膜的晶粒尺寸逐渐减小.晶界区过渡晶硅的比例减少,晶粒界面随之消失,带隙呈持续增加趋势.该实验结果为nc-Si/SiOx薄膜在新型太阳电池中的应用提供了基础数据.

参考文献

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